【英文标准名称】:StandardTestMethodforApplicationofIonizationChamberstoAssesstheLowEnergyGammaComponentofCobalt-60IrradiatorsUsedinRadiation-HardnessTestingofSiliconElectronicDevices
【原文标准名称】:硅电子器件辐射强度试验用钴60辐射源的低能γ成分评估的电离箱的应用的标准试验方法
【标准号】:ASTME1250-1988(2005)
【标准状态】:现行
【国别】:
【发布日期】:1988
【实施或试行日期】:
【发布单位】:美国材料与试验协会(US-ASTM)
【起草单位】:E10.07
【标准类型】:(TestMethod)
【标准水平】:()
【中文主题词】:核能;电离;电子工程;电子仪器;硬度测量
【英文主题词】:absorbeddose;Co-60irradiators;doseenhancement;ionizationchamber;radiationhardnesstesting
【摘要】:AlthoughCo-60nucleionlyemitmonoenergeticgammaraysat1.17and1.33MeV,thefinitethicknessofsources,andencapsulationmaterialsandothersurroundingstructuresthatareinevitablypresentinirradiatorscancontributeasubstantialamountoflow-energygammaradiation,principallybyComptonscattering(1,2).3Inradiation-hardnesstestingofelectronicdevicesthislow-energyphotoncomponentofthegammaspectrumcanintroducesignificantdosimetryerrorsforadeviceundertestsincetheequilibriumabsorbeddoseasmeasuredbyadosimetercanbequitedifferentfromtheabsorbeddosedepositedinthedeviceundertestbecauseofabsorbeddoseenhancementeffects(3,4).Absorbeddoseenhancementeffectsrefertothedeviationsfromequilibriumabsorbeddosecausedbynon-equilibriumelectrontransportnearboundariesbetweendissimilarmaterials.Theionizationchambertechniquedescribedinthismethodprovidesaneasymeansforestimatingtheimportanceofthelow-energyphotoncomponentofanygivenirradiatortypeandconfiguration.Whenthereisanappreciablelow-energyspectralcomponentpresentinaparticularirradiatorconfiguration,specialexperimentaltechniquesshouldbeusedtoensurethatdosimetrymeasurementsadequatelyrepresenttheabsorbeddoseinthedeviceundertest.(SeePracticeE1249.)1.1LowenergycomponentsinthephotonenergyspectrumofCo-60irradiatorsleadtoabsorbeddoseenhancementeffectsintheradiation-hardnesstestingofsiliconelectronicdevices.Theselowenergycomponentsmayleadtoerrorsindeterminingtheabsorbeddoseinaspecificdeviceundertest.Thismethodcoversproceduresfortheuseofaspecializedionizationchambertodetermineafigureofmeritfortherelativeimportanceofsucheffects.Italsogivesthedesignandinstructionsforassemblingthischamber.1.2ThismethodisapplicabletomeasurementsinCo-60radiationfieldswheretherangeofexposureratesis7106to3102Ckg1s1(approximately100R/hto100R/s).Forguidanceinapplyingthismethodtoradiationfieldswheretheexposurerateis>100R/s,see.Note1SeeTerminologyE170fordefinitionofexposureanditsunits.1.3ThevaluesstatedinSIunitsaretoberegardedasthestandard.Thevaluesgiveninparenthesesareforinformationonly.Thisstandarddoesnotpurporttoaddressallofthesafetyconcerns,ifany,associatedwithitsuse.Itistheresponsibilityoftheuserofthisstandardtoestablishappropriatesafetyandhealthpracticesanddeterminetheapplicabilityofregulatorylimitationspriortouse.
【中国标准分类号】:L10
【国际标准分类号】:31_020
【页数】:11P.;A4
【正文语种】:


【英文标准名称】:Electromechanicalelementaryrelays-Part1:Generalandsafetyrequirements
【原文标准名称】:机电式元件继电器.第1部分:一般要求和安全要求
【标准号】:IEC61810-1-2004
【标准状态】:作废
【国别】:国际
【发布日期】:2004-11
【实施或试行日期】:
【发布单位】:国际电工委员会(IEC)
【起草单位】:IEC/TC94
【标准类型】:()
【标准水平】:()
【中文主题词】:"有"或"无"继电器;影响量;爬电距离;触点继电器;测量;继电器;绝缘电阻;间隙;尺寸选定;绝缘配合;时间响应;表面安装;定义;线路图;技术数据单;机电学;规范(验收);试验;表面安装设备;介电强度;漏电路径;数据记录;电气工程;寿命;试验条件;电信;规范;机电的;连接;测量技术;绝缘;插接件连接;密封性;安全部件
【英文主题词】:All-or-nothingrelays;Circuitdiagrams;Clearances;Connections;Connectoredjoints;Contactrelays;Creepagedistances;Datarecording;Definition;Definitions;Dielectricstrength;Dimensioning;Electricalengineering;Electromechanical;Electromechanics;Influencequantity;Insulatingresistance;Insulationcoordination;Insulations;Leakagepaths;Life(durability);Measurement;Measuringtechniques;Relays;Safetycomponents;SMD;Specification;Specification(approval);Surfacemounting;Technicaldatasheets;Telecommunications;Testing;Testingconditions;Tightness;Timeresponse
【摘要】:Appliestoelectromechanicalelementaryrelays(non-specifiedtimeall-or-nothingrelays)anddefinesthebasicsafety-relatedandfunctionalrequirementsforapplicationsinallareasofelectricalengineeringorelectronics.
【中国标准分类号】:L25
【国际标准分类号】:29_120_70
【页数】:138P.;A4
【正文语种】:英语